ÉÁ²¥¸£Àû¿â

Search Results

ELEG 53603. Semiconductor Material and Device Characterization. 3 Hours.

This course provides an overview of semiconductor characterization techniques in industry: Electrical measurements, Optical measurements, Electron and ion beam measurements, X-ray and probe measurements. Prerequisite: ·¡³¢·¡³ÒÌý42003 or ·¡³¢·¡³ÒÌý52003 and instructor consent. (Typically offered: Irregular)